Our research interests focus on applying and developing transmission electron microscopy techniques to determine the atomic structure of material defects, thus providing insight into observed properties. This is particularly important as electronic devices scale to ever-vanishingly small dimensions when the detailed arrangement of atoms at interfaces begins to critically influence material properties.
Junghwa Kim
kjunghwa@mit.edu
Menglin Zhu
mlz@mit.edu
Michael Xu
mxu86@mit.edu
Aaditya Bhat
aadibhat@mit.edu
Bridget Denzer
bridget8@mit.edu
Bonnie Lin
yxlin@mit.edu
Sayantan Mondal
sayan199@mit.edu
Former Students
- Xi Chen (Thermo Fisher Scientific)
- Abinash Kumar (Nanospective)
- Aubrey Penn (MIT.nano)
- Matt Cabral (University of Rhode Island)
- Everett Grimley (SAS)
- Houston Dycus (Evan Analytical Group)
- Adedapo Oni (Intel Corporation)
- Bahar M.Alipour (Boston Consulting Group)
Former Postdocs
- Dennis Kim (University of Florida)
- Matthew Hauwiller (Seagate)
- Rohan Dhall (Molecular Foundary, LBNL)
- Weizong Xu (Applied Materials)
- Xiahan Sang (Wuhan University of Technology)
- Ryan White (NIST, Boulder, CO)
Former UROP/Visitors
- Eyosias A Gebremeskel – MIT UROP
- Gabriela Corea – MIT UROP
- Anna Kaleta – visiting student (Institute of Physics, Polish Academy of Sciences)
- Sam Frisone (Uni. of Michigan)
Group leader
Prof. James LeBeau earned his BS in materials science & engineering in 2006 from Rensselaer Polytechnic Institute. He then went on to the University of California at Santa Barbara where he earned his PhD in 2010. After graduating, he joined the faculty in the Department of Materials Science & Engineering at NCSU in 2011 and was promoted to the rank of Associate Professor in 2016. In 2019, he moved the group to MIT.